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application/pdfIEEE2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2019; ; ; FPGAfault toleranceSEUscrubbingconfiguration memoryScatter Scrubbing: A Method to Reduce SEU Repair Time in FPGA Configuration MemoryMahsa MousaviHamid Reza PourshaghaghiHenk CorporaalAkash Kumar
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)1 Oct. 20196
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